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MaxEye.P
FUTEC MAXEYE.P The high-end defect detection system by FUTEC, called the MaxEye.P, uses five state-of-the-art image processing steps. They include:
These defect detection processing steps provide the highest quality performance ever from a FUTEC control system. On top of the high quality image process system, the MaxEye.P was designed with various functions based on customer feedback received over the past 25 years. Today the MayxEye.P is one of the most powerful and easiest to use defect detection systems on the market. MaxEye.P has various technologies that support the detector itself as well as achieving powerful, flexible, high-quality control. Defect Classification MaxEye.P: Applicable Lines: Film Lines, Paper Mills, Metal Finishing Lines, Slitter Machines , Coating Lines, Coil lines and others. MaxEye.P Defect types: Foreign Matters, Pinholes, Streaks, Contaminations, Dimples and Dents, and many other defects. Features & Benefits
MaxEye.P Features & Benefits: Features:
System Configuration
System Configuration for MaxEye.P: There are two lighting methods used for detection of defects: Reflection or Transmission. The standard lighting system, diffuse reflection, works with all opaque materials such as papers, carton laminates and foils. The transmission lighting system, placed under the web, works with translucent materials such as films. A combination of both can be used. Basic system components are:
Specifications
There
are two MaxEye.P Models to choose from:
Operation
MaxEye.P Operation Flexible Inspection Lanes Mask-out a certain lane Overlapping Lanes Product Code Registration Validate Roll/Batch Number Multiple (External) Outputs Password Self-Diagnosis Display Camera Signal Monitoring Screens
System Monitoring for MaxEye.P: Flaw map The flaw map screen shows the defect distribution over the web in cross-web and down-web direction, so that operators can visually recognize the quality of the product now under production at a glance. This also helps identify the causes of these defects without losing time. Collective Images Screen (Flaw Map plus) Existing flaw maps only showed defects as "points", which might be only good for evaluating products in a wide range. However, for the area where these defects ('point") are gathered together, it could be insufficient. MaxEye.P has a collective image system to solve this problem. Collective Images Screen attaches the images of any defect-concentrated-point (10 square centimeters), enabling easy evaluation. The defect evaluation of the whole defect-concentrated area can be done visually. Trend Graph The graph shows defects in bar chart format by lane and/or by the rank and/or by the group of defects. This helps control the quality of slit rolls in terms or quantity or types of defects included. Multiple Defect Images By displaying 20 defect images simultaneously, all defects of the same group can be checked efficiently. Operators can specify the causes of defects by observing the development or reduction of serious or sequential defects. Furthermore, in order to check and review the production performance efficiently, this system can playback these images. |
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